Thiel, Brad L.: search on Z-Library

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1

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Alternative Lithographic Technologies VII - Massively parallel E-beam inspection: enabling next-generation patterned defect inspection for wafer and mask manufacturing

Resnick, Douglas J., Bencher, Christopher, Malloy, Matt, Thiel, Brad, Bunday, Benjamin D., Wurm, Stefan, Mukhtar, Maseeh, Quoi, Kathy, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomas

Year:

2015

Language:

english

File:

PDF, 694 KB

english, 2015

2

AP Statistics: Building Bridges Between High School and College Statistics Education

Franklin, Christine, Hartlaub, Brad, Peck, Roxy, Scheaffer, Richard, Thiel, David, Tranbarger Freier, Katherine

Journal:

The American Statistician

Year:

2011

Language:

english

File:

PDF, 115 KB

english, 2011

3

Measuring multielectron beam imaging fidelity with a signal-to-noise ratio analysis

Mukhtar, Maseeh, Bunday, Benjamin D., Quoi, Kathy, Malloy, Matt, Thiel, Brad

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2016

Language:

english

File:

PDF, 4.03 MB

english, 2016

4

Patterned Wafer Inspection with Multi-beam SEM Technology

Thiel, Brad, Mukhtar, Maseeh, Quoi, Kathy, Bunday, Benjamin D., Malloy, Matt

Journal:

Microscopy and Microanalysis

Year:

2016

Language:

english

File:

PDF, 517 KB

english, 2016

5

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Enabling inspection solutions for future mask technologies through the development of massively parallel E-Beam inspection

Behringer, Uwe F.W., Finders, Jo, Malloy, Matt, Thiel, Brad, Bunday, Benjamin D., Wurm, Stefan, Jindal, Vibhu, Mukhtar, Maseeh, Quoi, Kathy, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski,

Year:

2015

Language:

english

File:

PDF, 997 KB

english, 2015

6

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Simulating massively parallel electron beam inspection for sub-20 nm defects

Cain, Jason P., Sanchez, Martha I., Bunday, Benjamin D., Mukhtar, Maseeh, Quoi, Kathy, Thiel, Brad, Malloy, Matt

Year:

2015

Language:

english

File:

PDF, 1.80 MB

english, 2015

7

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Further advancing the throughput of a multi-beam SEM

Cain, Jason P., Sanchez, Martha I., Kemen, Thomas, Malloy, Matt, Thiel, Brad, Mikula, Shawn, Denk, Winfried, Dellemann, Gregor, Zeidler, Dirk

Year:

2015

Language:

english

File:

PDF, 1.23 MB

english, 2015

8

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 24 February 2008)] Advances in Resist Materials and Processing Technology XXV - Photons, electrons, and acid yields in EUV photoresists: a progress report

Brainard, Robert, Hassanein, Elsayed, Li, Juntao, Pathak, Piyush, Thiel, Brad, Cerrina, Franco, Moore, Richard, Rodriguez, Miguel, Yakshinskiy, Boris, Loginova, Elena, Madey, Theodore, Matyi, Richard,

Year:

2008

Language:

english

File:

PDF, 563 KB

english, 2008

9

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Critical dimension small angle X-ray scattering measurements of FinFET and 3D memory structures

Settens, Charles, Bunday, Benjamin, Thiel, Brad, Kline, R. Joseph, Sunday, Daniel, Wang, Chengqing, Wu, Wen-li, Matyi, Richard, Starikov, Alexander, Cain, Jason P.

Year:

2013

Language:

english

File:

PDF, 528 KB

english, 2013

10

Composite Microstructure of Spider ( Nephila Clavipes) Dragline

Thiel, Brad, Kunkel, Dennis, Guess, Keith, Viney, Christopher

Journal:

MRS Proceedings

Year:

1993

Language:

english

File:

PDF, 3.21 MB

english, 1993

11

[IEEE 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2015.5.3-2015.5.6)] 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Enabling future generation high-speed inspection through a massively parallel e-beam approach

Malloy, Matt, Bunday, Benjamin, Wurm, Stefan, Thiel, Brad, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomasz, Dellemann, Gregor, Peters, Jan Hendrik

Year:

2015

Language:

english

File:

PDF, 990 KB

english, 2015

12

Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Electron Beam Critical Dimension Metrology Tool

Mukhtar, Maseeh, Thiel, Brad

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 307 KB

english, 2017

13

Tensile mechanical property evaluation of natural and epoxide-treated silk fibers

Dwayne L. Dunaway, Brad L. Thiel, Christopher Viney

Journal:

Journal of Applied Polymer Science

Year:

1995

Language:

english

File:

PDF, 906 KB

english, 1995

14

It Takes a Village to Raise an Information Technology Project: Suggestions on Collaboration From Our 10-Community-College Consortium

Grandgenett, Neal, Thiele, Levi, Pensabene, Tom, McPeak, Brad

Journal:

Community College Journal of Research & Practice

Year:

2015

Language:

english

File:

PDF, 107 KB

english, 2015

15

SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 16 September 2014)] Scanning Microscopies 2014 - Assessing the viability of multi-electron beam wafer inspection for sub-20nm defects

Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Thiel, Brad, Lercel, Michael, Bunday, Benjamin, Malloy, Matt

Year:

2014

Language:

english

File:

PDF, 464 KB

english, 2014

16

Utilization of an Integrated Clinical Experience in a Physical Therapist Education Program

Mai, Jennifer A., Thiele, Alecia, O’Dell, Bill, Kruse, Brad, Vaassen, Mimi, Priest, Andrew

Journal:

Journal of Physical Therapy Education

Year:

2013

File:

PDF, 206 KB

2013

17

Patterned Wafer Inspection with Multi-beam SEM Technology

Thiel, Brad, Mukhtar, Maseeh, Quoi, Kathy, Bunday, Benjamin D., Malloy, Matt

Journal:

Microscopy and Microanalysis

Year:

2016

File:

PDF, 517 KB

2016

18

Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Electron Beam Wafer Defect Inspection Tool

Mukhtar, Maseeh, Quoi, Kathy, Bunday, Benjamin D, Malloy, Matt, Thiel, Brad

Journal:

Microscopy and Microanalysis

Year:

2016

Language:

english

File:

PDF, 453 KB

english, 2016

19

Non-periodic lattice crystals in the hierarchical microstructure of spider (major ampullate) silk

Brad L. Thiel, Keith B. Guess, Christopher Viney

Journal:

Year:

1997

Language:

english

File:

PDF, 270 KB

english, 1997

20

SPIE Proceedings [SPIE Nondestructive Evaulation for Health Monitoring and Diagnostics - San Diego, CA (Sunday 6 March 2005)] Testing, Reliability, and Application of Micro- and Nano-Material Systems III - Self-regulating charge control for ultra high resolution scanning electron microscopy (Invited Paper)

Geer, Robert E., Toth, Milos, Thiel, Brad L., Meyendorf, Norbert, Baaklini, George Y., Knowles, William R., Michel, Bernd

Year:

2005

Language:

english

File:

PDF, 8.21 MB

english, 2005

21

Physical and chemical microstructure of spider dragline: A study by analytical transmission electron microscopy

Brad L. Thiel, Dennis D. Kunkel, Christopher Viney

Journal:

Year:

1994

Language:

english

File:

PDF, 1.22 MB

english, 1994

22

Association between reactive oxygen species and disease activity in chronic hepatitis C

Nicola De Maria, Alessandra Colantonl, Stefano Fagiuoli, Guang-Jun Liu, Brad K. Rogers, Fabio Farinati, David H. Van Thiel, Robert A. Floyd

Journal:

Free Radical Biology and Medicine

Year:

1996

Language:

english

File:

PDF, 415 KB

english, 1996

23

Structural Investigation of (Ad II)26 Fiber, a Novel Bioengineered Material Based on a Viral Spike Protein

Gillespie, D. Blake, Thiel, Brad L., Trabbic, Kimberly A., Viney, Christopher, Yager, Paul

Journal:

Year:

1994

Language:

english

File:

PDF, 3.82 MB

english, 1994

24

Multiple-Beam Scanning Electron Microscopy

Lena Eberle, Anna, Schalek, Richard, Lichtman, Jeff W., Malloy, Matt, Thiel, Brad, Zeidler, Dirk

Journal:

Microscopy Today

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

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